Ellipsometry is a nondestructive and highly sensitive optical measurement technique used to analyze thin-layer stacks. We are a noteworthy supplier of the same for our highly honoured clients. Ellipsometer is based on the observation that polarized light reflected from the surface with thin layer is changing polarization state, e.g. linearly polarized light will, in general case, change to elliptically polarized - hence, the name "ellipsometry". This change of polarization state can be related to optical thickness of the layer(s).